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Structure and morphology of nickel-alumina/silica solar thermal selective absorbers
| Forfatter | Boström Tobias, Valizadeh S., Lu J., Westin G., Wäckelgård E. |
|---|---|
| Bok/tidsskrift | Journal of Non-Crystalline Solids |
| Forlag | Elsvier |
| Rapportnr. | ISSN 0022-3093, Volume 357, Issue 5, 1370-1375. DOI: 10.1016/j.jnoncrysol.2010.09.023 |
| Årstall | 2011 |
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Nickel-alumina/silica thin film materials for the use in solar thermal absorbers have been investigated usin Scanning Electron Microscopy (SEM), Transmission Electron Microscopy (TEM) and Elastic Recoil Detection Analysis (ERDA). The TEM images relealed that all layers have a very small thickness variation and that the layers are completely homogenous. The final curing temperature revealed to be of importance for the formation of cracks and the surface morphology.
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